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Designing for Reliability in Compact, High-Power Systems: Insights from Ryan Smart, VP of Product at Harwin
An interview with Ryan Smart, VP of Product at Harwin, discussing the challenges of shielding in high-reliability connectors, high-current design trends, and the hybrid power-and-signal connector layouts.
Double-Pulse Testing for Power Semiconductor Devices with Infineon's EVAL-DCLINK-DPT Evaluation Board
Infineon's EVAL-DCLINK-DPT is used to perform double pulse testing for high-voltage power devices to evaluate switching losses, turn-on and turn-off behavior, reverse recovery, gate waveform integrity, parasitic effects, and safe operating margins under defined voltage and current conditions.
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