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Latest Posts
Microfocus X-Ray Sources for Li-ion Batteries: High-Resolution Inspection from Cylindrical to Prismatic Cells
This article examines the application of MFX source technology in inspecting cylindrical, pouch, and prismatic battery cells, highlighting its technical advantages, integration capabilities, and the increasing need for such inspections in modern manufacturing environments.
The CMM System Remastering Aerospace & Defence Metrology with Speed, Simplicity, and Seamless Connectivity
The new MAESTRO by Hexagon is setting a new benchmark in CMM technology with its fast, user-friendly and fully connected design to meet the real-time demands of aerospace & defence manufacturer.
webinar | JUN 05 - JUN 05, 2025
Join MVTec to explore how advanced machine vision software is revolutionizing semiconductor wafer inspection with live demos, not slides—boosting precision, quality, and efficiency.
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