Evaluation Board for High-Voltage Switching Analysis

Infineon Technologies EVAL-DCLINK-DPT Evaluation Board

The Infineon Technologies EVAL-DCLINK-DPT Evaluation Board is designed for double-pulse testing (DPT) of power semiconductor devices, including IGBTs and silicon carbide MOSFETs. The board integrates an EiceDRIVER™ gate driver IC with a CoolSiC™ 1200 V MOSFET in a TO263-7 package, enabling controlled evaluation of switching behavior under defined test conditions. A configurable DC-link stage with integrated film capacitors supports high-speed switching while minimizing parasitic effects, allowing accurate characterization of turn-on and turn-off performance.The design supports bus voltages up to 800 V and includes an active discharge circuit to reduce residual energy after testing. Visual safety indicators provide operational status feedback during high-voltage measurements. Breakout connections are available for external load inductors, and the board can be interconnected with alternative gate drivers or package evaluation boards. The DC-input configuration and compact 220 mm × 120 mm × 50 mm form factor support laboratory-based power device evaluation and comparative testing workflows.<h3>EVAL-DCLINK-DPT Evaluation Board Features  </h3>The EVAL-DCLINK-DPT Evaluation Board features integrated gate driving, configurable DC-link capacitance, high-voltage operation up to 800 V, safety circuits, and flexible interconnections for double pulse testing of power devices. Let’s go through its features in detail: Double Pulse Testing CapabilityThe EVAL-DCLINK-DPT Evaluation Board is designed to support double pulse testing (DPT) for power semiconductor characterization. It enables controlled measurement of switching behaviour in IGBTs and silicon carbide MOSFETs, enabling analysis of turn-on and turn-off transients under defined operating conditions.Power Stage and Gate Driver IntegrationThe board integrates a CoolSiC™ 1200 V MOSFET in a TO263-7 package, driven by an onboard EiceDRIVER™ gate driver IC. This configuration provides a representative test environment for evaluating high-speed switching performance and gate-drive behavior in wide-bandgap devices.DC-Link and Voltage HandlingA configurable DC-link stage with integrated film capacitors is included to minimize parasitic inductance and support accurate waveform capture during high-speed operation. The design withstands DC bus voltages up to 800 V and incorporates an active discharge circuit to safely reduce stored energy after testing.Safety, Connectivity, and Form FactorThe board includes visual safety indicators that indicate the operating status during high-voltage testing. Breakout connections allow attachment of external load inductors, and interconnection with alternative gate drivers or package evaluation boards is supported. The DC-input design is housed in a 220 mm × 120 mm × 50 mm form factor and complies with RoHS requirements.<h3>Applications</h3>The EVAL-DCLINK-DPT Evaluation Board is used for characterizing power semiconductor switching behavior in high-power conversion systems. In battery energy storage systems (BESS), it supports the evaluation of IGBTs and SiC MOSFETs used in bidirectional converters. For electric vehicle charging applications, the board enables analysis of high-voltage switching losses and transient performance. In industrial motor drives and control systems, it helps validate device behavior under fast-switching and high-current conditions. The board is also applicable to uninterruptible power supplies (UPS), where reliable switching performance is critical, and photovoltaic power converters, enabling accurate assessment of device efficiency and switching dynamics in DC-link stages.

Infineon Technologies EVAL-DCLINK-DPT Evaluation Board - Product Brief

Supported Test Method

Supported Devices

Integrated Power Device

Gate Driver

Maximum DC Bus Voltage

Input Type

Qualification

Applications

The Infineon Technologies EVAL-DCLINK-DPT Evaluation Board is designed for double-pulse testing (DPT) of power semiconductor devices, including IGBTs and silicon carbide MOSFETs.

Supported Test Method	Double Pulse Testing (DPT)
Supported Devices	IGBTs and SiC MOSFETs
Integrated Power Device	CoolSiC™ 1200 V MOSFET (TO263-7 Package)
Gate Driver	EiceDRIVER™ Gate Driver IC
Maximum DC Bus Voltage	Up to 800 V
Input Type	DC Input